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TOF-SIMS Imaging of Biological Tissue Sections and Structural ...
Web17 nov. 2024 · Time-of-flight secondary ion MS (ToF-SIMS) is a surface analysis technique able to provide in situ label- and matrix-free chemical information from sample surfaces and in three dimensions (3D)... WebSurfacelab 6 7 Software, supplied by Ion-tof GmbH, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, … philomath gleaners
Multivariate Statistical Analysis, Part 1 - YouTube
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